Fatigue behaviour of Pb(Zr,Ti)O3/PbZrO3 multilayer ferroelectric thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 9 B, 2006, Pages 7275-7278

  Alkoy, Sedat ^a,b   Alkoy, Ebru Mensur ^a   Uchiyama, Kiyoshi ^a   Shiosaki, Tadashi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b GEBZE TECHNICAL UNIVERSITY   (Turkey)

Author keywords

Buffer layers; Fatigue; Lead zirconate titanate; Thin films

Indexed keywords

FATIGUE OF MATERIALS; MAGNETRON SPUTTERING; MIXTURES; MULTILAYERS; SECONDARY ION MASS SPECTROMETRY; SOL-GELS; SPIN COATING;

BUFFER LAYERS; GRAIN SIZE DISTRIBUTION; LEAD ZIRCONATE TITANATE; REMNANT POLARIZATION;

FERROELECTRIC THIN FILMS;

EID: 33749007645     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.7275     Document Type: Article

References (14)

1. M. Dawber, K. M. Rabe and J. F. Scott: Rev. Mod. Phys. 77 (2005) 1083.
2. M. Dawber and J. F. Scott: Appl. Phys. Lett. 76 (2000) 1060.
3. I. K. Yoo and S. B. Desu: Mater. Sci. Eng. B 13 (1992) 319.
4. T. Mihara, H. Watanabe and C. A. Paz de Araujo: Jpn. J. Appl. Phys. 33 (1994) 3996.
5. W. L. Warren, D. Dimos, B. A. Tuttle, R. D. Nasby and G. E. Pike: Appl. Phys. Lett. 65 (1994) 1018.
6. E. S. Lee, H. W. Chung, S. H. Lim and S. Y. Lee: Appl. Phys. Lett. 86 (2005) 032903.
7. O. Auciello, K. D. Gifford and A. I. Kingon: Appl. Phys. Lett. 64 (1994) 2873.
8. D. P. Birnie III, M. H. Jilavi, T. Krajewski and R. Nab: J. Sol-Gel Sci. Technol. 13 (1998) 855.
9. J. H. Jang and K. H. Yoon: Appl. Phys. Lett. 75 (1999) 130.
10. H. Doi, T. Atsuki, N. Soyama, G. Sasaki, T. Yonezawa and K. Ogi: Jpn. J. Appl. Phys. 33 (1994) 5159.
11. X. Du and I. W. Chen: J. Appl. Phys. 83 (1998) 7789.
12. E. Mensur Alkoy, S. Alkoy, K. Uchiyama and T. Shiosaki: Jpn. J. Appl. Phys. 45 (2006) 5110.
13. E. Mensur Alkoy, S. Alkoy, K. Uchiyama and T. Shiosaki: J. Appl. Phys. 99 (2006) 106106.
14. S. Okamura, M. Takaoka, T. Nishida and T. Shiosaki: Jpn. J. Appl. Phys. 39 (2000) 5481.