Degradation under high-field stress and gate stress of AlGaN/GaN HEMTs

Wuli Xuebao/Acta Physica Sinica

Volumn 58, Issue 1, 2009, Pages 511-517

  Gu, Wen Ping ^a,b   Hao, Yue ^a,b   Zhang, Jin Cheng ^a,b   Wang, Chong ^a,b   Feng, Qian ^a,b   Ma, Xiao Hua ^a,b  

^a XIDIAN UNIVERSITY   (China)

^b BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

AlGaN GaN HEMTs; Stress; Surface states (virtual gate); Traps in AlGaN barrier

Indexed keywords

EID: 60749123092     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (18)

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