Measurement of secondary electron emission coefficient (γ) of MgO protective layer with various crystallinities

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 12 B, 1998, Pages 7015-7018

  Choi, Eun Ha ^a   Oh, Hyun Joo ^a   Kim, Young Guon ^a   Ko, Jae Jun ^a   Lim, Jae Yong ^a   Kim, Jin Goo ^a   Kim, Dae Il ^a   Cho, Guangsup ^a   Kang, Seung Oun ^a  

^a Kwangwoon University   (South Korea)

Author keywords

Ar+ and Ne+ ions; Crystallinity; MgO protective layer; Secondary electron emission coefficient

Indexed keywords

EID: 0000261148     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.7015     Document Type: Article

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