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Volumn 25, Issue 12, 2008, Pages 4368-4370

Achieving thin films with micro/nano-scale controllable morphology by glancing angle deposition technique

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION RATES; MORPHOLOGY; PHYSICAL VAPOR DEPOSITION; ROTATION RATE;

EID: 58449096202     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/12/051     Document Type: Article
Times cited : (1)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.