Growth, characterization and optical properties of nanocrystalline gadolinia thin films prepared by sol-gel dip coating

Journal of Physics D: Applied Physics

Volumn 41, Issue 22, 2008, Pages

  Ferrara, M C ^b   Altamura, D ^a,b   Schioppa, M ^b   Tapfer, L ^b   Nichelatti, E ^b   Pilloni, L ^b   Montecchi, M ^b  

^a NATIONAL NANOTECHNOLOGY LABORATORY   (Italy)

^b ENEA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDS; CRYSTALLINE MATERIALS; DIFFUSION COATINGS; EMISSION SPECTROSCOPY; FIELD EMISSION; FILM GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; FUSED SILICA; GADOLINIUM; GELATION; GELS; GRAVIMETRIC ANALYSIS; GROWTH (MATERIALS); INFRARED SPECTROSCOPY; NANOCRYSTALLINE SILICON; OPTICAL PROPERTIES; OXYGEN; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SOL-GEL PROCESS; SOL-GELS; SOLS; SPECTROSCOPIC ANALYSIS; SUBSTRATES; THERMOANALYSIS; X RAY DIFFRACTION ANALYSIS;

BLUE SHIFTS; CHEMICAL COMPOSITIONS; CRYSTALLINE GRAINS; DIP COATINGS; ELECTRONIC TRANSITIONS; FIELD EMISSION SCANNING ELECTRON MICROSCOPIES; FOURIER TRANSFORM INFRARED; FTIR ANALYSES; GADOLINIA; GRAIN SIZES; NANOCRYSTALLINE; NANOSTRUCTURED; OPTICAL SPECTROSCOPIES; ORGANIC RESIDUALS; QUANTUM CONFINEMENT EFFECTS; SILICON SUBSTRATES; SUBSTRATE PROPERTIES; SYMMETRY GROUPS; THIN LAYERS; X-RAY DIFFRACTIONS;

FILM PREPARATION;

EID: 58149286355     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/22/225408     Document Type: Article

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