Environmental chamber for an atomic force microscope

Review of Scientific Instruments

Volumn 78, Issue 4, 2007, Pages

  Lievonen, J ^a   Ranttila, K ^a   Ahlskog, M ^a  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; PRESSURE EFFECTS; VACUUM APPLICATIONS;

ALUMINUM CHAMBER; ATOMIC FORCE MICROSCOPES; GASEOUS ATMOSPHERE; VACUUM LEVELS;

ENVIRONMENTAL CHAMBERS;

ALUMINUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; GAS; HUMIDITY; INSTRUMENTATION; METHODOLOGY; PRESSURE;

ALUMINUM; GASES; HUMIDITY; MICROSCOPY, ATOMIC FORCE; PRESSURE;

EID: 34247572061     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2719598     Document Type: Article

References (8)

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6. InfiniMax, from Infinity Photo-Optical Co., USA.
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8. M. He, A. Szuchmacher-Blum, D. E. Aston, C. Buenviaje, and R. M. Overney, J. Chem. Phys. 0021-9606 10.1063/1.1331298 114, 1355 (2001).