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Journal of Applied Physics

Volumn 104, Issue 11, 2008, Pages

Secondary electron emission from freely supported nanowires

(6) Suzuki, Makoto a,b Kumagai, Kazuhiro a,b Sekiguchi, Takashi a,b Cassell, Alan M c Saito, Tsutomu d Yang, Cary Y d

a UNIVERSITY OF TSUKUBA (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c NASA AMES RESEARCH CENTER (United States)

d Department of Computer Science and Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC WIRE; ELECTRON BEAMS; ELECTRON EMISSION; MONTE CARLO METHODS; NANOWIRES; NITRIDES; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SPONTANEOUS EMISSION;

BULK MATERIALS; HYBRID NANOWIRES; METALLIC NANOWIRES; MONTE CARLO TECHNIQUES; SCANNING ELECTRONS; SECONDARY ELECTRON EMISSIONS; SECONDARY ELECTRONS; SPECIMEN CHARGING; TOTAL EMISSIONS;

ELECTRONS;

EID: 58149267472 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3032910 Document Type: Article

Times cited : (21)

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