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Volumn 100, Issue 10, 2006, Pages

Bright contrast imaging of carbon nanofiber-substrate interface

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ENERGY UTILIZATION; INTERFACES (MATERIALS); SCANNING ELECTRON MICROSCOPY;

EID: 33845212850     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2382718     Document Type: Article
Times cited : (14)

References (19)
  • 10
    • 33845197128 scopus 로고    scopus 로고
    • Proceedings of 32th International Symposium for Testing and Failure Analysis, Texas, 12-16 November
    • M. Suzuki, Y. Ominami, Q. Ngo, K. Mcilwrath, K. Jarausch, A. M. Cassell, J. Li, and C. Y. Yang, Proceedings of 32th International Symposium for Testing and Failure Analysis, Texas, 12-16 November 2006 (unpublished).
    • (2006)
    • Suzuki, M.1    Ominami, Y.2    Ngo, Q.3    McIlwrath, K.4    Jarausch, K.5    Cassell, A.M.6    Li, J.7    Yang, C.Y.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.