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Volumn 19, Issue 3, 2001, Pages 866-869
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Secondary electron emission characteristics for sol-gel based SiO2 thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRON MULTIPLIERS;
SECONDARY EMISSION;
SILICA;
SOL-GELS;
SUBSTRATES;
THERMAL EFFECTS;
VACUUM;
MICROCHANNEL PLATES (MCP);
THIN FILMS;
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EID: 0035326319
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1373640 Document Type: Conference Paper |
Times cited : (3)
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References (12)
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