-
1
-
-
27744511939
-
-
J. Y. Huang, S. Chen, S. H. Jo, Z. Wang, D. X. Han, G. Chen, M. S. Dresselhaus, and Z. F. Ren, Phys. Rev. Lett. 94, 236802 (2005).
-
(2005)
Phys. Rev. Lett.
, vol.94
, pp. 236802
-
-
Huang, J.Y.1
Chen, S.2
Jo, S.H.3
Wang, Z.4
Han, D.X.5
Chen, G.6
Dresselhaus, M.S.7
Ren, Z.F.8
-
4
-
-
33745787237
-
-
S. Jesse, M. A. Guillorn, I. N. Ivanov, A. A. Puretzky, J. Y. Howe, P. F. Britt, and D. B. Geohegan, Appl. Phys. Lett. 89, 013114 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 013114
-
-
Jesse, S.1
Guillorn, M.A.2
Ivanov, I.N.3
Puretzky, A.A.4
Howe, J.Y.5
Britt, P.F.6
Geohegan, D.B.7
-
8
-
-
0005836651
-
-
R. Martel, T. Schmidt, H. R. Shea, T. Hertel, and Ph. Avouris, Appl. Phys. Lett. 73, 2447 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 2447
-
-
Martel, R.1
Schmidt, T.2
Shea, H.R.3
Hertel, T.4
Avouris, Ph.5
-
9
-
-
0030544674
-
-
A. Y. Kasumov, I. I. Khodos, P. M. Ajayan, and C. Colliex, Europhys. Lett. 34, 429 (1996).
-
(1996)
Europhys. Lett.
, vol.34
, pp. 429
-
-
Kasumov, A.Y.1
Khodos, I.I.2
Ajayan, P.M.3
Colliex, C.4
-
11
-
-
12844284568
-
-
S. B. Chikkannanavar, D. E. Luzzi, S. Paulson, and A. T. Johnson, Jr., Nano Lett. 5, 151 (2005).
-
(2005)
Nano Lett.
, vol.5
, pp. 151
-
-
Chikkannanavar, S.B.1
Luzzi, D.E.2
Paulson, S.3
Johnson Jr. A., T.4
-
12
-
-
28344450015
-
-
T. Kim, J.-M. Zuo, E. A. Olson, and I. Petrov, Appl. Phys. Lett. 87, 173108 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.87
, pp. 173108
-
-
Kim, T.1
Zuo, J.-M.2
Olson, E.A.3
Petrov, I.4
-
13
-
-
28844432673
-
-
E. Pop, D. Mann, J. Cao, Q. Wang, K. Goodson, and H. Dai, Phys. Rev. Lett. 95, 155505 (2005).
-
(2005)
Phys. Rev. Lett.
, vol.95
, pp. 155505
-
-
Pop, E.1
Mann, D.2
Cao, J.3
Wang, Q.4
Goodson, K.5
Dai, H.6
-
15
-
-
28844492067
-
-
M. Lazzeri, S. Piscanec, F. Mauri, A. C. Ferrari, and J. Robertson, Phys. Rev. Lett. 95, 236802 (2005).
-
(2005)
Phys. Rev. Lett.
, vol.95
, pp. 236802
-
-
Lazzeri, M.1
Piscanec, S.2
Mauri, F.3
Ferrari, A.C.4
Robertson, J.5
-
16
-
-
8344282816
-
-
J. C. Meyer, D. Obergfell, S. Roth, S. Yang, and S. Yang, Appl. Phys. Lett. 85, 2911 (2004).
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 2911
-
-
Meyer, J.C.1
Obergfell, D.2
Roth, S.3
Yang, S.4
Yang, S.5
-
17
-
-
0003594635
-
-
2nd ed. (Springer, Berlin
-
B. Fultz and J. M. Howe, Transmission Electron Microscopy and Diffractometry of Materials, 2nd ed. (Springer, Berlin, 2005), Chap., pp. 63-104.
-
(2005)
Transmission Electron Microscopy and Diffractometry of Materials
, pp. 63-104
-
-
Fultz, B.1
Howe, J.M.2
-
21
-
-
0014731669
-
-
0003-6951 10.1063/1.1653139
-
O. C. Wells, Appl. Phys. Lett. 0003-6951 10.1063/1.1653139 16, 151 (1970); O. C. Wells, Appl. Phys. Lett. 19, 232 (1971).
-
(1970)
Appl. Phys. Lett.
, vol.16
, pp. 151
-
-
Wells, O.C.1
-
22
-
-
0003439876
-
-
O. C. Wells, Appl. Phys. Lett. 0003-6951 10.1063/1.1653139 16, 151 (1970); O. C. Wells, Appl. Phys. Lett. 19, 232 (1971).
-
(1971)
Appl. Phys. Lett.
, vol.19
, pp. 232
-
-
Wells, O.C.1
-
24
-
-
34648814307
-
-
29th International Symposium for Testing and Failure Analysis, Santa Clara, CA
-
W. E. Vanderlinde, 29th International Symposium for Testing and Failure Analysis, Santa Clara, CA, 2003 (unpublished), pp. 158-165.
-
(2003)
, pp. 158-165
-
-
Vanderlinde, W.E.1
-
25
-
-
0842285843
-
-
S. Helveg, C. López-Cartes, J. Sehested, P. L. Hansen, B. S. Clausen, J. R. Rostrup-Nielsen, F. Abild-Pedersen, and J. K. Nørskov, Nature (London) 427, 426 (2004).
-
(2004)
Nature (London)
, vol.427
, pp. 426
-
-
Helveg, S.1
López-Cartes, C.2
Sehested, J.3
Hansen, P.L.4
Clausen, B.S.5
Rostrup-Nielsen, J.R.6
Abild-Pedersen, F.7
Nørskov, J.K.8
-
26
-
-
13744260653
-
-
A. V. Melechko, V. I. Merkulov, T. E. McKnight, M. A. Guillorn, K. L. Klein, D. H. Lowndes, and M. L. Simpson, J. Appl. Phys. 97, 041301 (2005).
-
(2005)
J. Appl. Phys.
, vol.97
, pp. 041301
-
-
Melechko, A.V.1
Merkulov, V.I.2
McKnight, T.E.3
Guillorn, M.A.4
Klein, K.L.5
Lowndes, D.H.6
Simpson, M.L.7
-
27
-
-
33645648242
-
-
Q. Ngo, A. M. Cassell, A. J. Austin, J. Li, S. Krishnan, M. Meyyappan, and C. Y. Yang, IEEE Electron Device Lett. 27, 221 (2006).
-
(2006)
IEEE Electron Device Lett.
, vol.27
, pp. 221
-
-
Ngo, Q.1
Cassell, A.M.2
Austin, A.J.3
Li, J.4
Krishnan, S.5
Meyyappan, M.6
Yang, C.Y.7
-
28
-
-
0031587897
-
-
Y. Chen, Z. L. Wang, J. S. Yin, D. J. Johnson, and R. H. Prince, Chem. Phys. Lett. 272, 178 (1997).
-
(1997)
Chem. Phys. Lett.
, vol.272
, pp. 178
-
-
Chen, Y.1
Wang, Z.L.2
Yin, J.S.3
Johnson, D.J.4
Prince, R.H.5
-
29
-
-
0032491482
-
-
Z. F. Ren, Z. P. Huang, J. W. Xu, J. H. Wang, P. Bush, M. P. Siegal, and P. N. Provencio, Science 282, 1105 (1998).
-
(1998)
Science
, vol.282
, pp. 1105
-
-
Ren, Z.F.1
Huang, Z.P.2
Xu, J.W.3
Wang, J.H.4
Bush, P.5
Siegal, M.P.6
Provencio, P.N.7
-
30
-
-
0141955825
-
-
B. A. Cruden, A. M. Cassell, Q. Ye, and M. Meyyappan, J. Appl. Phys. 94, 4070 (2003).
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 4070
-
-
Cruden, B.A.1
Cassell, A.M.2
Ye, Q.3
Meyyappan, M.4
-
31
-
-
4544358474
-
-
S. Takeuchi, A. Muto, M. Nakagawa, S. White, R. Tamochi, M. Sato, M. Yamada, and D. C. Joy, Microsc. Microanal. 10, 950 (2004).
-
(2004)
Microsc. Microanal.
, vol.10
, pp. 950
-
-
Takeuchi, S.1
Muto, A.2
Nakagawa, M.3
White, S.4
Tamochi, R.5
Sato, M.6
Yamada, M.7
Joy, D.C.8
-
32
-
-
33845212850
-
-
M. Suzuki, Y. Ominami, Q. Ngo, C. Y. Yang, T. Yamada, A. M. Cassell, and J. Li, J. Appl. Phys. 100, 104305 (2006).
-
(2006)
J. Appl. Phys.
, vol.100
, pp. 104305
-
-
Suzuki, M.1
Ominami, Y.2
Ngo, Q.3
Yang, C.Y.4
Yamada, T.5
Cassell, A.M.6
Li, J.7
-
36
-
-
0000212732
-
-
Z. Czyewski, D. O. MacCallum, A. Roming, and D. C. Joy, J. Appl. Phys. 68, 3066 (1990).
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 3066
-
-
Czyewski, Z.1
MacCallum, D.O.2
Roming, A.3
Joy, D.C.4
-
42
-
-
34248140835
-
-
One exception is anisotropic SE emission from the clean single crystal surface in ultrahigh vacuum (< 10-10 Torr) as discussed by J. Burns [Phys. Rev. 119, 102 (1960)].
-
(1960)
Phys. Rev.
, vol.119
, pp. 102
-
-
Burns, J.1
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