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Volumn 23, Issue 6, 2005, Pages 2763-2768

Negative charging-up contrast formation of multilayered structures with a nonpenetrating electron beam in scanning-electron microscope

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRON BEAMS; ELECTRON MICROSCOPES; INSULATING MATERIALS; IRRADIATION; SCANNING;

EID: 29044446336     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2101757     Document Type: Article
Times cited : (21)

References (18)
  • 10
    • 29044435865 scopus 로고
    • Proceedings of the XIth International Congress on Electron Microscopy
    • H. Fujioka, K. Nakamae, and K. Ura, Proceedings of the XIth International Congress on Electron Microscopy, 1988, p. 643.
    • (1988) , pp. 643
    • Fujioka, H.1    Nakamae, K.2    Ura, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.