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Journal of Applied Physics

Volumn 104, Issue 11, 2008, Pages

Tip size effects on atomic force microscopy nanoindentation of a gold single crystal

(3) Lucas, Marcel a Gall, Ken b Riedo, Elisa a

a GEORGIA INSTITUTE OF TECHNOLOGY (United States)

b Georgia Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; HARDNESS; IMAGE ENHANCEMENT; NANOINDENTATION; SINGLE CRYSTALS;

AFM IMAGES; ATOMIC FORCES; BEFORE AND AFTER; DEPTH DEPENDENCES; DEPTH RANGES; HARDNESS VALUES; INDENTER; INDENTERS; NANOINDENTATION TESTS; NANOMETER SCALES; PENETRATION DEPTHS; PROJECTED AREAS; RESIDUAL INDENTS; SHARP INDENTER; SHARP TIPS; SIZE EFFECTS; SIZE SCALE EFFECTS; TIP RADIUSES; TWO DIFFERENT METHODS;

VICKERS HARDNESS TESTING;

EID: 58149216252 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3039511 Document Type: Article

Times cited : (20)

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