Nanochemical characterizations of metals and thin films

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 302-306

  Goken M ^a,b   Kempf, M ^a   Bordenet, M ^a   Vehoff, H ^a  

^a SAARLAND UNIVERSITY   (Germany)

^b Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; GRAIN BOUNDARIES; HARDNESS; MECHANICAL PROPERTIES; METALLOGRAPHIC MICROSTRUCTURE; METALS; PLASTIC DEFORMATION; SHEAR STRENGTH; SHEAR STRESS; THICKNESS MEASUREMENT; THIN FILMS;

LOAD DISPLACEMENT CURVES; NANOINDENTATION; NANOMECHANICAL CHARACTERIZATION; YIELD POINT;

NANOSTRUCTURED MATERIALS;

EID: 0345504766     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<302::AID-SIA503>3.0.CO;2-D     Document Type: Article

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