Fast second-order statistical static timing analysis using parameter dimension reduction

Proceedings - Design Automation Conference

Volumn , Issue , 2007, Pages 244-249

  Feng, Zhuo ^a   Li, Peng ^a   Zhan, Yaping ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

Parameter dimension reduction; Process variation; Statistical timing

Indexed keywords

PARAMETER DIMENSION REDUCTION; PROCESS VARIATION; STATISTICAL TIMING;

COMPUTATIONAL COMPLEXITY; LOGIC DESIGN; NANOTECHNOLOGY; PARAMETER ESTIMATION; STATIC ANALYSIS; VLSI CIRCUITS;

MULTIPROCESSING SYSTEMS;

EID: 34547308113     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2007.375161     Document Type: Conference Paper

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