Active hardware metering for intellectual property protection and security

16th USENIX Security Symposium

Volumn , Issue , 2007, Pages 291-306

  Alkabani, Yousra M ^a   Koushanfar, Farinaz ^a  

^a Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; INTELLECTUAL PROPERTY;

ACTIVE HARDWARE METERING; BENCHMARK CIRCUIT; EXPERIMENTAL EVALUATION; INTELLECTUAL PROPERTY PROTECTION; MANUFACTURING TECHNOLOGIES; POTENTIAL ATTACK; STATES AND TRANSITIONS; TRANSITION TABLE;

HARDWARE SECURITY;

EID: 85077688405     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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