Within-die gate delay variability measurement using re-configurable ring oscillator

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2008, Pages 133-136

  Das, Bishnu Prasad ^a   Amrutur, Bharadwaj ^a   Jamadagni, H S ^a   Arvind, N V ^b   Visvanathan, V ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b TEXAS INSTRUMENTS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT TECHNIQUES; CONFIGURABLE; DELAY MEASUREMENTS; GATE DELAYS; ON CHIPS; PHYSICAL PROXIMITIES; PROCESS NODES; RECONFIGURABLE; RING OSCILLATORS; SYSTEM OF LINEAR EQUATIONS; TEST CHIPS; VARIATIONS OF;

DIES; NETWORKS (CIRCUITS); REVERSE OSMOSIS;

INTEGRATED CIRCUITS;

EID: 57849104032     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2008.4672039     Document Type: Conference Paper

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