Circuits for on-chip sub-nanosecond signal capture and characterization

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2001, Pages 251-254

  Abaskharoun, N ^a   Roberts, G W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BANDWIDTH COMPRESSION; CMOS INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; NANOTECHNOLOGY; SIGNAL DETECTION; TIMING JITTER;

JITTER MEASUREMENT; ON CHIP DIGITIZER; ON CHIP SIGNAL CAPTURE; SUBNANOSECOND SIGNAL CAPTURE; TIME TO DIGITAL CONVERTER;

INTEGRATED CIRCUIT TESTING;

EID: 0034829997     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. A stand-alone integrated excitation extraction system for analog BIST applications
2. A robust deep submicron DC voltage generator
3. Measuring jitter of high speed data channels using undersampling techniques
4. A semidigital dual delay-locked loop
5. Precise delay generation using coupled oscillators
6. A high-resolution CMOS time-to-digital converter utilizing a vernier delay line