TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits

Proceedings of the IEEE Great Lakes Symposium on VLSI

Volumn , Issue , 2003, Pages 76-79

  Ostermann, Timm ^a   Deutschmann, Bernd ^b  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b NONE

Author keywords

Electromagnetic emission (EME); Surface scan method; TEM Cell method

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; MAGNETOELECTRIC EFFECTS; MICROPROCESSOR CHIPS; NUMERICAL METHODS; RELIABILITY;

ELECTROMAGNETIC EMISSION (EME);

INTEGRATED CIRCUITS;

EID: 0038714069     PISSN: 10661395     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/764825.764829     Document Type: Conference Paper

References (8)

1. M. L. Crawford: "Generating of Standard EM Fields Using TEM transmission cells.", IEEE Trans. on Electromagnetic Compatibility, vol. EMC-16, no.4, nov. 1974, pp. 189-195
2. R. De Smedt, S. Criel, F. Bonjean, G. Spildooren, G. Monier, B. Demoulin, and J. Baudet, "TEM Cell Measurement of an Active EMC Test Chip," in Proceedings of the IEEE International Symposium on EMC, Washington DC, USA, pp. 903-908
3. IEC 61967-1, Ed.l: Integrated circuits - Measurement of electromagnetic emissions, 150kHz to IGHz - Part 1: General conditions and definitions, Final Draft International Standard47A/61967-1/Ed.1, 47A/632/FDIS, 2001-12-14
4. IEC 61967-2, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -Part 2: Measurement of radiated emissions, TEM-cell method and wideband TEM-cell method (150 kHz to 8 GHz)", 47A/619/NP, New Work Item Proposal, Date of proposal: Jul. 2001
5. IEC 61967-3: "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -Part 3: Measurement of radiated emissions, surface scan method (10 kHz to 3 GHz)", 47A/620/NP, New Work Item Proposal, Date of proposal: Jul. 2001
6. IEC 47A/552/NP, "Universal testboard for measurement of EMC of ICs", SC47A/WG9, New Work Item Proposal, Date of proposal: Feb. 1999
7. IEC 62132-1: "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to IGHz - Part 1: General and definitions", 47A/618/CD
8. T. Ostermann, D. Schneider, C. Bacher, B. Deutschmann, R. Jungreithmair, W. Gut, C. Lackner, R. Koessl, R. Hagelauer: "Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM cell method (IEC 61967-2)" 3rd International Workshop on Electromagnetic Compatibility of Integrated Circuits, 14-15. Nov. 2002, Toulouse, France, pp. 57-60