Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1996, Pages 1119-1123

  Haelvoet, K ^a   Criel, S ^a   Dobbelaere, F ^a   Martens, L ^a   De Langhe, P ^a   De Smedt, R ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC FIELDS; ELECTRONIC EQUIPMENT; PERFORMANCE; PRINTED CIRCUIT BOARDS; RADIATION; SCANNING; THREE DIMENSIONAL;

ACCURATE CHARACTERIZATION; DIAGNOSTIC TOOL; NEAR FIELD SCANNER; THREE DIMENSIONAL CARTESIAN GRID; THREE DIMENSIONAL SCANNING SYSTEM;

ELECTROMAGNETIC FIELD MEASUREMENT;

EID: 0029703375     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)