Using near-field scanning to predict radiated fields

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2004, Pages 14-18

  Shi, Jin ^a   Cracraft, Michael A ^a   Zhang, Jianmin ^a   DuBroff, Richard E ^a   Slattery, Kevin ^b   Yamaguchi, Masahiro ^c  

^a University of Missouri Rolla   (United States)

^b INTEL CORPORATION   (United States)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

EMI; Equivalent current; Near field

Indexed keywords

EQUIVALENT CURRENTS; NEAR-FIELD SCANNING; VECTOR NETWORK ANALYZERS (VNA); WAVE SPECTRUM;

COMPUTER CONTROL; COMPUTER SIMULATION; DIGITAL CIRCUITS; ELECTRIC CURRENTS; ELECTROMAGNETIC WAVES; FINITE DIFFERENCE METHOD; GREEN'S FUNCTION; INTEGRATED CIRCUITS; SCANNING; SIGNAL INTERFERENCE; TIME DOMAIN ANALYSIS; VECTORS;

MAGNETIC FIELDS;

EID: 4644310472     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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9. Glenn S. Smith, An Introduction to Classical Electromagnetic Radiation. Cambridge, United Kingdom: Cambridge University Press, 1997, ch.4, pp.262-272
10. Jin Shi, M.A. Cracraft, K. P. Slattery, Masahiro Yamaguchi and R.E. DuBroff, "Calibration and compensation of near-field scan measurements for EMI characterization", IEEE Trans. Electromagn. Compat., submitted for publication