Near-field techniques for detecting EMI sources

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2004, Pages 11-13

  Baudry, D ^a   Bicrel, F ^a   Bouchelouk, L ^a   Louis, A ^a   Mazari, B ^a   Eudeline, P ^b  

^a École Supérieure d'Ingénieurs en Génie Électrique   (France)

^b THALES   (France)

Author keywords

Component; Electric field; EMC; Near field measurement; Probe

Indexed keywords

COMPUTER SIMULATION; DIODES; ELECTRIC FIELDS; ELECTROMAGNETIC COMPATIBILITY; ELECTRONIC EQUIPMENT; MAPPING; MATHEMATICAL MODELS; MICROSTRIP LINES; PASSIVE NETWORKS; POSITION MEASUREMENT;

DIODE LIMITERS; NEAR-FIELD MAPPING SYSTEMS; NEAR-FIELD MEASUREMENTS; POSITIONING SYSTEMS;

SIGNAL INTERFERENCE;

EID: 4644364743     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. D. Baudry, A. Louis, B. Mazari, Near-field Measurement for automotive application, ICONIC 2003, Rouen, 2003.
2. Y. Gao, I. Wolff, Measurements of Fields Distributions and Scattering Parameters in Multiconductor Structures Using an Electric Field Probe, IEEE MTT-S Digest, pp. 1741-1744, 1997.
3. S. K. Dutta, C. P. Vlahacos, D.E. Steinhauer, A. S. Thanawalla, B. J. Feenstra, F. C. Wellstood, S. M. Anlage, Imaging microwave electric fields using a near-field scanning microwave microscope, Applied Physics Letters, vol. 74, no 1, pp. 156-158, January 1999.
4. J.J. Laurin, Z. Ouardhiri, J. Colinas, "Near-field Imaging of Radiated Emission Sources on Printed-Circuit Boards", IEEE International Symposium on Electromagnetic Compatibility, pp. 368-373, 2001.