Measurements of field distributions and scattering parameters in multiconductor structures using an electric field probe

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1997, Pages 1741-1744

  Gao, Yingjie ^a   Wolff, Ingo ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE SCATTERING; MICROWAVE CIRCUITS;

MULTICONDUCTOR STRUCTURES;

MICROSTRIP LINES;

EID: 0030704905     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)