Reducing contact resistance using compliant nickel nanowire arrays

IEEE Transactions on Components and Packaging Technologies

Volumn 31, Issue 4, 2008, Pages 859-868

  Baek, Stanley S ^a   Fearing, Ronald S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Constriction resistance; Electrical contact resistance (ECR); Electrical contacts; Electrodeposition; Nanowires

Indexed keywords

CONTACT RESISTANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONTACTS; ELECTRIC NETWORK ANALYSIS; ELECTRIC WIRE; ELECTROFORMING; EXPERIMENTS; FORMING; MANGANESE COMPOUNDS; NANOWIRES; NICKEL; NICKEL ALLOYS; PROBES; SPHERES;

CONSTRICTION RESISTANCE; ELECTRICAL CONTACT RESISTANCE (ECR); ELECTRICAL CONTACT RESISTANCES; ELECTRICAL CONTACTS; FABRICATION METHODS; FLAT SHEETS; FLAT TIPS; NICKEL FIBERS; NICKEL NANOWIRES; POROUS FILTERS; RESISTANCE REDUCTIONS; SPHERICAL PROBES; SURFACE CONTACTS;

SURFACE RESISTANCE;

EID: 57349187198     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2008.2004576     Document Type: Article

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