Six-gigahertz equivalent circuit model of an RF membrane probe card

IEEE Transactions on Instrumentation and Measurement

Volumn 55, Issue 3, 2006, Pages 989-994

  Wartenberg, Scott A ^a,b  

^a RF MICRO DEVICES   (United States)

^b BOOZ ALLEN HAMILTON   (United States)

Author keywords

Manufacturing; On wafer; Probe card; Production test; Radio frequency (RF) membrane probe

Indexed keywords

ELECTRONICS PACKAGING; INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS; PROBES; RADIO EQUIPMENT; WSI CIRCUITS;

MEMBRANE PROBE CARD; PRODUCTION TEST; RADIO FREQUENCY WAFER TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 33744513154     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2006.873809     Document Type: Article

References (11)

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