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Volumn 26, Issue 3, 2003, Pages 318-326

Thermal Solutions for Discrete and Wafer-Level RF MEMS Switch Packages

Author keywords

Discrete package; Heat dissipation; MEMS packaging; RF MEMS switch; Thermal enhancement; Wafer level

Indexed keywords

LOW TEMPERATURE EFFECTS; POWER AMPLIFIERS; SEMICONDUCTING GALLIUM ARSENIDE; SUBSTRATES; WSI CIRCUITS;

EID: 0142196115     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2003.817962     Document Type: Article
Times cited : (18)

References (11)
  • 4
    • 0033359554 scopus 로고    scopus 로고
    • Modeling of the millimeter-wave behavior of MEMS capacitive switches
    • L.Larissa Vietzorreck, "Modeling of the millimeter-wave behavior of MEMS capacitive switches," in Proc. Microwave Symp. Dig., IEEE MTT-S Int., vol. 4, 1999, pp. 1685-1688.
    • (1999) Proc. Microwave Symp. Dig., IEEE MTT-S Int. , vol.4 , pp. 1685-1688
    • Larissa Vietzorreck, L.1
  • 7
    • 0029543057 scopus 로고
    • A surface micromachined miniature switches for telecommunications applications with signal frequencies from DC up to 4 GHz
    • Stockholm, Sweden, June
    • J. J. Yao and M. F. Chang, "A surface micromachined miniature switches for telecommunications applications with signal frequencies from DC up to 4 GHz," in Proc. Int. Conf. Solid-State Sensors Actuators Dig., Stockholm, Sweden, June 1995, pp. 384-387.
    • (1995) Proc. Int. Conf. Solid-state Sensors Actuators Dig. , pp. 384-387
    • Yao, J.J.1    Chang, M.F.2
  • 8
    • 0037893798 scopus 로고    scopus 로고
    • Reliability studies of low-voltage RF MEMS switches
    • San Diego, CA, Apr. 8-11
    • D. Becher, R. Chan, M. Hattendorf, and M. Feng, "Reliability studies of low-voltage RF MEMS switches," in Proc. GaAs Mantech Conf., San Diego, CA, Apr. 8-11, 2002, pp. 54-57.
    • (2002) Proc. GaAs Mantech Conf. , pp. 54-57
    • Becher, D.1    Chan, R.2    Hattendorf, M.3    Feng, M.4
  • 10
    • 0033319678 scopus 로고    scopus 로고
    • Contact physics of gold microcontacts for MEMS switches
    • Sept
    • D.Daniel. Hyman and M-Mehran Mehregany, "Contact physics of gold microcontacts for MEMS switches," IEEE Trans. Comp. Packag, Technol., vol. 22, pp. 357-364, Sept. 1999.
    • (1999) IEEE Trans. Comp. Packag, Technol. , vol.22 , pp. 357-364
    • Hyman, D.D.1    Mehregany, M.M.2
  • 11
    • 0032028435 scopus 로고    scopus 로고
    • Measuring equipment and measurements of adhesion force between gold electrical contacts
    • Mar
    • A. Kobayashi, S. Takano, and T. Kubono, "Measuring equipment and measurements of adhesion force between gold electrical contacts," IEEE Trans. Comp., Packag. Manufact. A, vol. 21, pp. 46-53, Mar. 1998.
    • (1998) IEEE Trans. Comp., Packag. Manufact. A , vol.21 , pp. 46-53
    • Kobayashi, A.1    Takano, S.2    Kubono, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.