Soft X-ray microscopy at the NSLS

Synchrotron Radiation News

Volumn 16, Issue 3, 2003, Pages 11-15

  Beetz, Tobias ^a   Feser, Michael ^a   Fleckenstein, Holger ^a   Hornberger, Benjamin ^a   Jacobsen, Chris ^a   Kirz, Janos ^a   Lerotic, Mirna ^a   Lima, Enju ^a   Lu, Ming ^a   Sayre, David ^a   Shapiro, David ^a   Stein, Aaron ^b   Tennant, Don ^c   Wirick, Sue ^a  

^a STONY BROOK UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c New Jersey Nanotechnology Consortium   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 57049099768     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940880308603016     Document Type: Article

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