Illumination for coherent soft X-ray applications: The new X1A beamline at the NSLS

Journal of Synchrotron Radiation

Volumn 7, Issue 6, 2000, Pages 395-404

  Winn, B ^a   Ade, H ^b   Buckley, C ^c   Feser, M ^a   Howells, M ^d   Hulbert, S ^e   Jacobsen, C ^a   Kaznacheyev, K ^a   Kirz, J ^a   Osanna, A ^a   Maser, J ^a,f   McNulty, I ^f   Miao, J ^a,h   Oversluizen, T ^g   Spector, S ^a,i   Sullivan, B ^a,j   Wang, Yu ^a,k   Wirick, S ^a   Zhang, H ^b,l  

^a STONY BROOK UNIVERSITY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c KING'S COLLEGE LONDON   (United Kingdom)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

^f ARGONNE NATIONAL LABORATORY   (United States)

^g Creative Instrumentation   (United States)

^h SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

ⁱ MIT LINCOLN LABORATORY   (United States)

^j AIL Systems Inc   (United States)

^k XRADIA INC   (United States)

^l NONE   (Canada)

more..

Author keywords

Beamlines; Coherence; Microscopy; Soft X rays; Undulators

Indexed keywords

EID: 0034311250     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500012942     Document Type: Article

References (42)

1. Ade, H. (1998). Unpublished.
2. Ade, H., Kirz, J., Hulbert, S., Johnson, E., Anderson, E. & Kern, D. (1990). Appl. Phys. Lett. 56, 1841-1843.
3. Ade, H., Zhang, X., Cameron, S., Costello, C, Kirz, J. & Williams, S. (1992). Science, 258, 972-975.
4. Aoki, S., Ichihara, Y. & Kikuta, S. (1972). Jpn. J. Appl. Phys. 11, 1857.
5. Born, M. & Wolf, E. (1999). Principles of Optics. Cambridge University Press.
6. Buckley, C. J. (1988). X-ray Microscopy II, edited by D. Sayre, M. Howells, J. Kirz & H. Rarback, pp. 146-150. Berlin: Springer.
7. Buckley, C. J. (2000). X-ray Microscopy 1999, edited by W. Meyer-Ilse, A. Warwick & D. T. Attwood, pp. 33-40. Melville: American Institute of Physics.
8. Buckley, C. J. & Zhang, X. (1998). Proc. SPIE, 3449, 208-219.
9. Carlucci-Dayton, M. (2000). MSI thesis, SUNY, Stony Brook, New York, USA.
10. Chapman, H. N., Vogt, F. S., Jacobsen, C., Kirz, J., Miao, J., Winn, B., Wang, Y. & Oversluizen, T. (1999). J. Synchrotron Rad. 6, 50.
11. DaSilva, L. B., Trebes, J. E., Balhorn, R., Mrowka, S., Anderson, E., Attwood, D. T., Barbee, T. W. Jr., Brase, J., Corzett, M., Gray, J., Koch, J. A., Lee, C., Kern, D., London, R. A., MacGowan, B. J., Matthews, D. L. & Stone, G. (1992). Science, 258, 269-271.
12. DiGennaro, R., Gee, B., Guigli, J., Hogrefe, H., Howells, M. & Rarback, H. (1988). Nucl. Instrum. Methods, A266, 498-506.
13. DiGennaro, R. & Swain, T. (1990). Nucl. Instrum. Methods, A291, 313-318.
14. Feser, M., Beetz, T., Carlucci-Dayton, M. & Jacobsen, C. (2000). X-ray Microscopy 1999, edited by W. Meyer-Ilse, A. Warwick & D. T. Attwood, pp. 367-372. Melville: American Institute of Physics.
15. Gabor, D. (1949). Proc. R. Soc. London Ser. A, 197, 454-487.
16. Green, G. K. (1976). Report BNL-50522. Brookhaven National Laboratory, Upton, NY 11973, USA.
17. Hazel, R., Buckley, C., Hao, X., Jacobsen, C., Kirz, J., Oversluizen, T., Winn, B. & Wirick, S. (1998). Unpublished.
18. Howells, M. R., Kirz, J. & Krinsky, R. (1982). Report 32519. Brookhaven National Laboratory, Upton, NY 11973, USA.
19. Jacobsen, C., Howells, M., Kirz, J. & Rothman, S. (1990). J. Opt. Soc. Am. A7, 1847-1861.
20. Jacobsen, C., Kirz, J. & Williams, S. (1992). Ultramicroscopy, 47, 55-79.
21. Jacobsen, C. & Rarback, H. (1985). Proc. SPIE, 582, 201-211.
22. Jacobsen, C., Williams, S., Anderson, E., Browne, M. T., Buckley, C. J., Kern, D., Kirz, J., Rivers, M. & Zhang, X. (1991). Opt. Commun. 86, 351-364.
23. Jochum, L. & Meyer-Ilse, W. (1995). Appl. Opt. 34(22), 4944-4950.
24. Kim, K.-J. (1986). X-ray Data Booklet, edited by D. Vaughhan, §4.1. Center for X-ray Optics, Berkeley, CA, USA.
25. Kirz, J., Jacobsen, C. & Howells, M. (1995). Q. Rev. Biophys. 28, 33-130.
26. Kondratenko, A. M. & Skrinsky, A. N. (1977). Opt. Spectrosc. 42, 189-192.
27. Krinsky, S. (1983). IEEE Trans. Nucl. Sci. NS-30, 3078-3082.
28. Lindaas, S., Howells, M., Jacobsen, C. & Kalinovsky, A. (1996). J. Opt. Soc. Am. A13, 1788-1800.
29. McNulty, I., Kirz, J., Jacobsen C., Anderson, E. H., Howells, M. R. & Kern, D. P. (1992). Science, 256, 1009-1012.
30. Maser, J., Jacobsen, C., Osanna, A., Wang, S., Kalinovsky, A., Kirz, J., Spector, S. & Warnking, J. (1997). X-ray Microscopy and Spectromicroscopy, edited by J. Thieme, G. Schmahl, E. Umbach & D. Rudolph, pp. I-35-44. Berlin: Springer-Verlag.
31. Maser, J., Osanna, A., Wang, Y., Jacobsen, C., Kirz, J., Spector, S., Winn, B. & Tennant, D. (2000). J. Microsc. 197, 68-79.
32. Polack, F., Joyeux, D., Feser, M., Phalippou, D., Carlucci-Dayton, M., Kaznacheyev, K. & Jacobsen, C. (2000). X-ray Microscopy 1999, edited by W. Meyer-Ilse, A. Warwick & D. T. Attwood, pp. 573-580. Melville: American Institute of Physics.
33. Randall, K. J., Feldhaus, J., Erlebach, W., Bradhsaw, A. M., Eberhardt, W., Xu, Z., Ma, Y. & Johnson, P. D. (1992). Rev. Sci. Instrum. 63, 1367-1370.
34. Rarback, H., Buckley, C., Ade, H., Camillo, F., DiGennaro, R., Hellman, S., Howells, M., Iskander, N., Jacobsen, C., Kirz, J., Krinsky, S., Lindaas, S., McNulty, I., Oversluizen, M., Rothman, S., Sayre, D., Sharnoff, M. & Shu, D. (1990). J. X-ray Sci. Technol. 2, 274-296.
35. Rarback, H., Jacobsen, C., Kirz, J. & McNulty, I. (1988). Nucl. Instrum. Methods, A266, 96-105.
36. Rarback, H., Kenney, J. M., Kirz, J., Howells, M. R., Chang, P., Coane, P. J., Feder, R., Houzego, P. J., Kern, D. P. & Sayre, D. (1984). X-ray Microscopy, edited by G. Schmahl & D. Rudolph, pp. 203-215. Berlin: Springer-Verlag.
37. Safranek, J. (1998). Personal communication.
38. Samson, J. A. R. (1967). Techniques of Vacuum Ultraviolet Spectroscopy. New York: Wiley.
39. Sayre, D. & Chapman, H. N. (1995). Acta Cryst. A51, 237-252.
40. Trebes, J. E., Brown, S. B., Campbell, E. M., Matthews, D. L., Nilson, D. G., Stone, G. F. & Whelan, D. A. (1987). Science, 238, 517.
41. Vogt, S., Chapman, H. N., Jacobsen, C. & Medenvaldt, R. (2000). Ultramicroscopy. To be published.
42. Wang, Y., Jacobsen, C., Maser, J. & Osanna, A. (2000). J. Microsc. 197, 80-93.