Structural and electrical properties of Ge1 Sb2 Te4 face centered cubic phase

Journal of Applied Physics

Volumn 104, Issue 10, 2008, Pages

  Prokhorov, E ^a   Trapaga, G ^b   Gonzalez Hernandez J ^a  

^a CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CARRIER CONCENTRATION; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; DATA RECORDING; ELECTRIC PROPERTIES; GERMANIUM; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; TELLURIUM COMPOUNDS; THERMIONIC EMISSION; TRANSPORT PROPERTIES;

ANNEALING TEMPERATURES; APPLICATIONS.; CONDUCTION MODELS; CRYSTALLINE TRANSITIONS; DATA STORAGES; EFFECTIVE CAPACITANCES; ELECTRICAL PROPERTIES; FACE CENTERED CUBIC; GE:SB:TE; GRAIN SIZES; HALL MEASUREMENTS; MEASURING TEMPERATURES; MULTI STATES; PHASE CHANGES; POLYCRYSTAL LINES; POLYCRYSTALLINE STATES; POTENTIAL BARRIERS; ROOM TEMPERATURES; STRUCTURAL CONFIGURATIONS; STRUCTURAL PARAMETERS; X-RAY DIFFRACTIONS;

CARRIER MOBILITY;

EID: 57049087484     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3021462     Document Type: Article

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