On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images

Micron

Volumn 40, Issue 2, 2009, Pages 247-254

  Sang, Xiahan ^a,b   Du, Kui ^a   Zhuo, Mujin ^a,b   Ye, Hengqiang ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

High angle annular dark field image (HAADF); Image processing; Quantitative electron microscopy; Scanning transmission electron microscopy

Indexed keywords

ACOUSTIC INTENSITY; ATOMIC PHYSICS; IMAGE ENHANCEMENT; IMAGE PROCESSING; MICROSCOPIC EXAMINATION; RESTORATION; SCANNING ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC NUMBERS; CONTRAST IMAGES; HIGH RESOLUTIONS; HIGH-ANGLE ANNULAR DARK-FIELD IMAGE (HAADF); IMAGE NOISES; IMAGE SIMULATIONS; MAXIMUM ENTROPIES; OBJECT FUNCTIONS; QUANTITATIVE ELECTRON MICROSCOPY; RELATIVE INTENSITIES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL-TO-NOISE RATIOS; STEM IMAGES;

ATOMS;

EID: 56949108504     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2008.07.007     Document Type: Article

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