Scanning transmission electron microscopy studies of the microstructure and chemistry of the YBa2Cu3O(7-δ)/BaF2 interface

Micron

Volumn 30, Issue 5, 1999, Pages 437-447

  Lee, J L ^a   Weiss, C A ^a   Buhrman, R A ^a   Silcox, J ^a  

^a Cornell University   (United States)

Author keywords

Energy filtered imaging; Scanning transmission electron microscope; Superconducting quantum interference devices

Indexed keywords

EID: 0032746206     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00045-1     Document Type: Article

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