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Volumn 255, Issue 5 PART 1, 2008, Pages 1790-1795

Influence of RF power and fluorine doping on the properties of sputtered ITO thin films

Author keywords

Indium tin oxide; RF magnetron sputtering; Transparent conducting oxides

Indexed keywords

CONDUCTIVE FILMS; FLUORINE; INDIUM COMPOUNDS; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; SEMICONDUCTOR DOPING; SUBSTRATES; TIN OXIDES; TRANSPARENT CONDUCTING OXIDES;

EID: 56949090298     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.06.019     Document Type: Article
Times cited : (13)

References (30)
  • 16
    • 56949103514 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards, Powder Diffraction File Card No. 6-416, ASTM, Philadelphia, PA, 1967.
    • Joint Committee on Powder Diffraction Standards, Powder Diffraction File Card No. 6-416, ASTM, Philadelphia, PA, 1967.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.