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Volumn 322, Issue 1-2, 1998, Pages 56-62

Properties of indium tin oxide films prepared by rf reactive magnetron sputtering at different substrate temperature

Author keywords

Indium tin oxide; Magnetron sputtering; Substrate temperature

Indexed keywords

CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY MEASUREMENT; FILM PREPARATION; HIGH TEMPERATURE EFFECTS; LIGHT REFLECTION; MAGNETRON SPUTTERING; OPACITY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GLASS; SEMICONDUCTING INDIUM COMPOUNDS; SUBSTRATES; X RAY CRYSTALLOGRAPHY;

EID: 0032496535     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00939-5     Document Type: Article
Times cited : (160)

References (21)
  • 17
    • 0347687153 scopus 로고    scopus 로고
    • Materials 95-7 Encontro Nacional da Sociedade Portuguesa de Materiais, 17 a 20 de Setembro de 1995, Aveiro, Portugal
    • L.J. Meng, A. Azevedo, M.P. dos Santos, Materials 95-7 Encontro Nacional da Sociedade Portuguesa de Materiais, 17 a 20 de Setembro de 1995, Aveiro, Portugal, Materiais 95, Vol. 2, pp. 120-127.
    • Materiais 95 , vol.2 , pp. 120-127
    • Meng, L.J.1    Azevedo, A.2    Dos Santos, M.P.3
  • 19
    • 0345795324 scopus 로고    scopus 로고
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Card 6-0416, ASTM, Philadelphia, PA, 1967
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Card 6-0416, ASTM, Philadelphia, PA, 1967.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.