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Volumn 85, Issue 12, 2008, Pages 2346-2349
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Thermal stress effects of Ge2Sb2Te5 phase change material: Irreversible modification with Ti adhesion layers and segregation of Te
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Author keywords
Ge2Sb2Te5; Phase change material; Stress; Ti
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Indexed keywords
ADHESION;
ATOMIC PHYSICS;
ATOMS;
BUOYANCY;
EPITAXIAL GROWTH;
GERMANIUM;
LIFE CYCLE;
PHASE INTERFACES;
PHASE SEPARATION;
SEGREGATION (METALLOGRAPHY);
TELLURIUM COMPOUNDS;
ADHESION LAYERS;
BINARY PHASES;
CRYSTALLIZATION PROCESSES;
GE2SB2TE5;
IN CELLS;
MATERIAL PROPERTIES;
MEMORY CELLS;
PHASE CHANGES;
PHASE SEGREGATIONS;
STRESS EVOLUTIONS;
THERMAL ANNEAL;
TI;
PHASE CHANGE MEMORY;
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EID: 56649095817
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2008.09.009 Document Type: Article |
Times cited : (26)
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References (17)
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