Memory technologies in the nano-era: Challenges and opportunities

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 48, Issue , 2005, Pages

  Kim, Kinam ^a   Jeong, Gitae ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28144436568     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. J. Y. Kim et al., VLSI Digest of Technical Papers, pp.11-12, 2003.
2. J. H. Park et al., IEDM Tech. Dig., pp. 827-830, 2003.