Single event upset modeling with nuclear reactions in nanoscale electronics

Proceedings of The 15th International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2008

Volumn , Issue , 2008, Pages 443-448

  Turowski, M ^a   Fedoseyev, A ^a   Raman, A ^a   Warren, K ^b,c  

^a CFD RESEARCH CORPORATION   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c VANDERBILT UNIVERSITY   (United States)

Author keywords

Alpha particles; Ionizing radiation effects; Reliability; SET; SEU; Single event effects; Soft errors

Indexed keywords

ALPHA PARTICLES; ATMOSPHERIC RADIATION; CHARGED PARTICLES; ELECTRIC NETWORK ANALYSIS; ELECTRICAL ENGINEERING; ERROR CORRECTION; ERRORS; FLIP FLOP CIRCUITS; INTEGRATED CIRCUITS; IONIZING RADIATION; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NUCLEAR ENERGY; NUCLEAR PHYSICS; NUCLEAR REACTORS; RADIATION; RADIATION DAMAGE; RADIATION SHIELDING; RADIOACTIVITY; RELIABILITY; SPACE APPLICATIONS; STATIC RANDOM ACCESS STORAGE; TRANSIENTS; URANIUM POWDER METALLURGY;

IONIZING RADIATION EFFECTS; SET; SEU; SINGLE EVENT EFFECTS; SOFT ERRORS;

RADIATION EFFECTS;

EID: 56349146139     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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