Characterization of equalized and repeated interconnects for NoC applications

IEEE Design and Test of Computers

Volumn 25, Issue 5, 2008, Pages 430-439

  Kim, Byungsub ^a   Stojanović, Vladimir ^a  

^a USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP POWERS; INTER-CONNECTS;

ELECTRIC NETWORK TOPOLOGY;

EID: 55349118838     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2008.137     Document Type: Article

References (12)

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