Coulomb interaction among transporting charge carriers confined in two dimensions

Journal of Applied Physics

Volumn 104, Issue 8, 2008, Pages

  Buh, G H ^a   Park, Ji Yong ^b   Kuk, Young ^c  

^a Korea Research Institute of Chemical Technology   (South Korea)

^b Ajou University   (South Korea)

^c Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DISTRIBUTION; CHARGED PARTICLES; CIVIL AVIATION; ELECTRIC FIELDS; ELECTROSTATIC FORCE; MONTE CARLO METHODS; SEMICONDUCTOR DOPING; THICKNESS MEASUREMENT;

DIFFUSION CURRENTS; DRIFT CURRENTS; ELECTROSTATIC FORCE MICROSCOPIES; FICKIAN BEHAVIORS; GAUSSIAN; INDUCED ELECTRIC FIELDS; LOCALIZED CHARGES; LORENTZIAN; MICROMETER SIZES; MONTE CARLO SIMULATIONS; NONVOLATILE MEMORIES; OXIDE LAYERS; SMOLUCHOWSKI EQUATIONS; TIME EVOLUTIONS; TOTAL CHARGES; TWO DIMENSIONS;

CHARGE CARRIERS;

EID: 55249122469     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3006690     Document Type: Article

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