Infrared generalized ellipsometry on non-polar and superlattice group-III nitride films: Strain and phonon anisotropy

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 4, 2008, Pages 905-913

  Darakchieva, V ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

A-PLANE; ANISOTROPIC STRAINS; COMPLEX DEVICES; DOPING; FREQUENCY SHIFTS; GAN FILMS; GENERALIZED ELLIPSOMETRIES; HETEROEPITAXIAL; HETEROSTRUCTURES; HIGH-RESOLUTION; III NITRIDES; INFRARED; INFRARED SPECTROSCOPIC ELLIPSOMETRIES; OPTICAL PHONONS; ORIENTED FILMS; PHONON DEFORMATION POTENTIALS; PHONON FREQUENCIES; PHONON MODES; PRECISE; WURTZITE; X-RAY DIFFRACTIONS;

ANISOTROPY; ELLIPSOMETRY; FREQUENCY ESTIMATION; GALLIUM NITRIDE; NITRIDES; POLARIZATION; SEMICONDUCTING GALLIUM; SINGLE CRYSTALS; SPECTROSCOPIC ELLIPSOMETRY; ZINC SULFIDE;

PHONONS;

EID: 54849432667     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200777893     Document Type: Article

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