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Volumn 517, Issue 1, 2008, Pages 84-86
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Selective epitaxial growth of B-doped SiGe and HCl etch of Si for the formation of SiGe:B recessed source and drain (pMOS transistors)
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Author keywords
HCl etch; pMOSFET; Selective epitaxy growth; SiGe
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Indexed keywords
CRYSTAL GROWTH;
EPITAXIAL GROWTH;
EPITAXIAL LAYERS;
MOLECULAR BEAM EPITAXY;
MOSFET DEVICES;
SEMICONDUCTING GERMANIUM COMPOUNDS;
SILICON;
SILICON ALLOYS;
CHEMICAL VAPOR ETCHINGS;
HCL ETCH;
PATTERN DEPENDENCIES;
PMOS TRANSISTORS;
PMOSFET;
RECESSED SOURCE/DRAIN;
SELECTIVE EPITAXIAL GROWTHS;
SELECTIVE EPITAXY GROWTH;
SIGE;
SIGE LAYERS;
SOURCE AND DRAINS;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 54849412777
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.08.106 Document Type: Article |
Times cited : (9)
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References (16)
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