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Volumn 517, Issue 1, 2008, Pages 84-86

Selective epitaxial growth of B-doped SiGe and HCl etch of Si for the formation of SiGe:B recessed source and drain (pMOS transistors)

Author keywords

HCl etch; pMOSFET; Selective epitaxy growth; SiGe

Indexed keywords

CRYSTAL GROWTH; EPITAXIAL GROWTH; EPITAXIAL LAYERS; MOLECULAR BEAM EPITAXY; MOSFET DEVICES; SEMICONDUCTING GERMANIUM COMPOUNDS; SILICON; SILICON ALLOYS;

EID: 54849412777     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.08.106     Document Type: Article
Times cited : (9)

References (16)
  • 1
    • 54849439557 scopus 로고    scopus 로고
    • IEDM
    • Ghani T., et al. (2003), IEDM 978
    • (2003) , pp. 978
    • Ghani, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.