Miniaturization of a Fresnel spectrometer

Journal of Optics A: Pure and Applied Optics

Volumn 10, Issue 9, 2008, Pages

  Park, Yeonjoon ^a,e   Koch, Laura ^b   Song, Kyo D ^b   Park, Sangjoon ^c   King, Glen ^d   Choi, Sang ^d  

^a NATIONAL INSTITUTE OF AEROSPACE   (United States)

^b NORFOLK STATE UNIVERSITY   (United States)

^c Gachon University College of Medicine   (South Korea)

^d NASA LANGLEY RESEARCH CENTER   (United States)

^e The George Washington University   (United States)

Author keywords

Fresnel diffraction; Micro spectrometer; Miniaturization; Zone plate and circular grating

Indexed keywords

EID: 54749126924     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/1464-4258/10/9/095301     Document Type: Article

References (26)

1. Sinclair M B, Haaland D M, Timlin J A and Jones H D T 2006 Appl. Opt. 45 6283-91
2. Khang Y, Park Y, Salmeron M and Weber E R 1999 Rev. Sci. Instrum. 70 4595-9
3. Hanlon E B, Manoharan R, Koo T W, Shafer K E, Motz J T, Fitzmaurice M, Kramer J R, Itzkan I, Dasari R R and Feld M S 2000 Phys. Med. Biol. 45 R1-59
4. Avrutsky I, Chaganti K, Salakhutdinov I and Auner G 2006 Appl. Opt. 45 7811-7
5. Montgomery P C, Montaner D, Manzardo O, Flury M and Herzig H P 2004 Thin Solid Films 450 79-83
6. Kitaura N, Ogata S and Mori Y 1995 Opt. Eng. 34 584-8
7. Born M and Wolf E 1999 Principles of Optics 7th (expanded) edn (Cambridge: Cambridge University Press)
8. Ghatak A and Thyagarajan K 1989 Optical Electronics (New York: Cambridge University Press)
9. Marathay A S and McCalmont J F 2001 J. Opt. Soc. Am. A 18 2585-93
10. Park Y, Wright J D, Jensen J D L, King G C and Choi S H 2005 Meas. Sci. Technol. 16 2208-12
11. Teng S, Zhang N, Dong Q and Cheng C 2007 J. Opt. Soc. Am. A 24 3636-43
12. Fan Y H, Ren H W and Wu S T 2003 Opt. Express 11 3080-6
13. Honma M and Nose T 2005 Japan. J. Appl. Phys. 1 44 287-90
14. Lin T H, Huang Y H, Fuh A Y G and Wu S T 2006 Opt. Express 14 2359-64
15. Hirsch P M, Jordan J A and Lesem L B 1970 IBM Tech. Discl. Bull. 12 1806
16. Pfeiffer F, David C, van der Veen J F and Bergemann C 2006 Phys. Rev. B 73 245331
17. Fujita T, Nishihara H and Koyama J 1981 Opt. Lett. 6 613-5
18. Yasumoto M, Tamura S, Kamijo N, Suzuki Y, Awaji M, Takeuchi A, Takano H, Kohmura Y and Handa K 2001 Japan. J. Appl. Phys. 1 40 4747-48
19. Casey J D, Doyle A F, Lee R G, Stewart D K and Zimmermann H 1994 Microelectron. Eng. 24 43-50
20. Taniguchi J, Ohno N, Takeda S, Miyamoto I and Komuro M 1998 J. Vac. Sci. Technol. B 16 2506-10
21. Kopitkovas G, Lippert T, David C, Wokaun A and Gobrecht J 2004 Thin Solid Films 453/54 31-5
22. Saito Y, Matsubara T, Koga T, Kobayashi F, Kawahara T D and Nomura A 2005 Rev. Sci. Instrum. 76 106103
23. Hardeberg J Y, Schmitt F and Brettel H 2002 Opt. Eng. 41 2532-48
24. Sammar A and Andre J M 1993 J. Opt. Soc. Am. A 10 2324-37
25. Sammar A and Andre J M 1993 J. Opt. Soc. Am. A 10 600-13
26. Maser J 1992 X-ray Microscopy III (Berlin: Springer)