Microbeam grazing incidence small angle X-ray scattering - A new method to investigate heterogeneous thin films and multilayers

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 59, Issue 10-11, 2004, Pages 1765-1773

  Roth, S V ^a   Muller Buschbaum P ^b   Burghammer, M ^a   Walter, H ^c   Panagiotou, P ^b   Diethert, A ^b   Riekel, C ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c November AG   (Germany)

Author keywords

GISAXS; Microbeam; Self assembly

Indexed keywords

EVAPORATION; GOLD; LIGHT ABSORPTION; MORPHOLOGY; MULTILAYERS; NANOSTRUCTURED MATERIALS; POLYMERS; REFLECTION; X RAY ANALYSIS;

MICROBEAM; NOBLE METAL CLUSTERS; PLASMON RESONANCE; SELF-ASSEMBLY;

THIN FILMS;

EID: 5444267447     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.07.024     Document Type: Conference Paper

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