Grazing incidence small-angle X-ray scattering from laterally ordered triangular pyramidal Ge islands on Si(111)

Journal of Applied Crystallography

Volumn 33, Issue 3 I, 2000, Pages 433-436

  Paniago, R ^a   Metzger, H ^a   Rauscher, M ^a   Kovats, Z ^a   Peisl, J ^a   Schulze, J ^a   Eisele, I ^a   Ferrer, S ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; GERMANIUM; SILICON;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; GEOMETRY; PARTICLE SIZE; RADIATION SCATTERING; STRUCTURE ANALYSIS;

EID: 0034491567     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800099982     Document Type: Conference Paper

References (15)