The optical constants of metallic island films as used for surface enhanced infrared absorption

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 732-736

  Röseler, Arnulf ^a   Korte, Ernst Heiner ^a  

^a ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

Author keywords

Effective medium approximation; Infrared ellipsometry; Metallic island films; Optical constants; SEIRA

Indexed keywords

ADSORPTION; APPROXIMATION THEORY; COMPUTER SIMULATION; ELLIPSOMETRY; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; OPTICAL PROPERTIES;

EFFECTIVE MEDIUM APPROXIMATION; INFRARED ELLIPSOMETRY; SURFACE ENHANCED INFRARED ABSORPTION (SEIRA);

METALLIC FILMS;

EID: 0032000597     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00987-5     Document Type: Article

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