Characterization of materials with nanoscopic filler particles by AFM techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5392, Issue , 2004, Pages 148-157

  Vogel, Dietmar ^a   Keller, Jürgen ^b   Michel, Bernd ^a  

^a FRAUNHOFER IZM   (Germany)

^b AMIC Angewandte Micro Messtechnik GmbH   (Germany)

Author keywords

Composites; Nano particles; NanoDAC deformation measurement; Scanning probe microscopy

Indexed keywords

MICROGRAPHS; NANO PARTICLES; NANODAC DEFORMATION MEASUREMENT; SCANNING PROBE MICROSCOPY (SPM);

ATOMIC FORCE MICROSCOPY; DEFORMATION; ELASTIC MODULI; ELECTRIC CONDUCTIVITY; FRACTURE TOUGHNESS; IMAGING TECHNIQUES; MATERIALS HANDLING; NANOSTRUCTURED MATERIALS; POLYMERS; QUALITY CONTROL; THERMAL CONDUCTIVITY;

FILLERS;

EID: 5444245580     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.540073     Document Type: Conference Paper

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