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Volumn 1, Issue 1, 2008, Pages 485-504

Electron optics for low energy electron microscopy

Author keywords

Electron beam inspection system; Electron optics; Low energy electron microscope (LEEM)

Indexed keywords


EID: 54149090480     PISSN: 18753884     EISSN: 18753892     Source Type: Conference Proceeding    
DOI: 10.1016/j.phpro.2008.07.131     Document Type: Conference Paper
Times cited : (11)

References (22)
  • 15
    • 54149090746 scopus 로고
    • Ph.D. Dissertation, Technische Hochschule Darmstadt
    • R. Degenhardt, Ph.D. Dissertation, Technische Hochschule Darmstadt (1992).
    • (1992)
    • Degenhardt, R.1
  • 16
    • 54149089947 scopus 로고    scopus 로고
    • U.S. Patent, 6,586,733, July 1
    • L. Veneklasen and D.L. Adler; U.S. Patent # 6,586,733, July 1, 2003.
    • (2003)
    • Veneklasen, L.1    Adler, D.L.2
  • 17
    • 54149102564 scopus 로고    scopus 로고
    • U.S. Patent, 6,979,819, December 27
    • D.L. Adler and M. Marcus; U.S. Patent # 6,979,819, December 27, 2005.
    • (2005)
    • Adler, D.L.1    Marcus, M.2
  • 19
    • 54149086035 scopus 로고    scopus 로고
    • U.S. Patent, 6,936,816, August 30
    • M. Mankos, D.A. Soltz and H.F. Hess, U.S. Patent # 6,936,816, August 30, 2005.
    • (2005)
    • Mankos, M.1    Soltz, D.A.2    Hess, H.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.