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Volumn 1, Issue 1, 2008, Pages 485-504
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Electron optics for low energy electron microscopy
c
NONE
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Author keywords
Electron beam inspection system; Electron optics; Low energy electron microscope (LEEM)
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Indexed keywords
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EID: 54149090480
PISSN: 18753884
EISSN: 18753892
Source Type: Conference Proceeding
DOI: 10.1016/j.phpro.2008.07.131 Document Type: Conference Paper |
Times cited : (11)
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References (22)
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