SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 19, Issue SUPPL. 1, 2008, Pages

Effect of electrical operation on the defect states in organic semiconductors

(6) Nguyen, Thien Phap a Renaud, Cédric a Huang, Chun Hao b Lo, Chih Nan b Lee, Chih Wen a,b Hsu, Chain Shu b

a UNIVERSITÉ DE NANTES (France)

b NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND EDGES; CAPTURE CROSS SECTIONS; DEEP LEVELS; DEFECT STATES; DEGRADATION MECHANISMS; ELECTRICAL STRESSING; FLUORENYL; HALF LIFE TIME; LIGHT-EMITTING DEVICES; ORGANIC SEMICONDUCTORS; TRANSIENT SPECTROSCOPY; TRAP PARAMETERS;

ACTIVATION ENERGY; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEGRADATION;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 53649099228 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-008-9693-2 Document Type: Article

Times cited : (8)

References (22)

1
- 33644529203
- T.P. Nguyen, Recent Res. Dev. Polym. Sci. 6, 45 (2002)
- (2002) Recent Res. Dev. Polym. Sci. , vol.6 , pp. 45
- Nguyen, T.P.¹

2
- 0032083454
- doi: 10.1016/S0379-6779(98)00031-9
- J.R. Sheats, D.B. Roitman, Synthetic Metals 95, 79 (1998) doi: 10.1016/ S0379-6779(98)00031-9
- (1998) Synthetic Metals , vol.95 , pp. 79
- Sheats, J.R.¹ Roitman, D.B.²

3
- 8544278942
- doi: 10.1021/cm040081o
- H. Aziz, Z. Popovic, Chem. Mater. 16, 4522 (2004) doi: 10.1021/cm040081o
- (2004) Chem. Mater. , vol.16 , pp. 4522
- Aziz, H.¹ Popovic, Z.²

4
- 0031547427
- doi: 10.1016/S0169-4332(96)00931-2
- C.W. Wang, T.J. Sheu, Y.K. Su, M. Yokoyama, Appl. Surf. Sci. 113/114, 709 (1997) doi: 10.1016/S0169-4332(96)00931-2
- (1997) Appl. Surf. Sci. , vol.113-114 , pp. 709
- Wang, C.W.¹ Sheu, T.J.² Su, Y.K.³ Yokoyama, M.⁴

5
- 0034823532
- doi: 10.1016/S0379-6779(00)01359-X
- J. Steiger, S. Karg, R. Schmechel, H. Von Seggern, Synthetic Metals 122, 49 (2001) doi: 10.1016/S0379-6779(00)01359-X
- (2001) Synthetic Metals , vol.122 , pp. 49
- Steiger, J.¹ Karg, S.² Schmechel, R.³ Von Seggern, H.⁴

6
- 0344063395
- doi: 10.1143/JJAP.42.5672
- Y. Hashimoto, T. Kawai, M. Takada, S. Maeta, M. Hamagaki, T. Sakakibara, Jpn. J. Appl. Phys. 42, 5672 (2003) doi: 10.1143/JJAP.42.5672
- (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 5672
- Hashimoto, Y.¹ Kawai, T.² Takada, M.³ Maeta, S.⁴ Hamagaki, M.⁵ Sakakibara, T.⁶

7
- 0033593747
- doi: 10.1063/1.123469
- H.L. Gomes, P. Stallinga, H. Rost, A.B. Holmes, M.G. Harrison, R.H. Friend, Appl. Phys. Lett. 74, 1144 (1999) doi: 10.1063/1.123469
- (1999) Appl. Phys. Lett. , vol.74 , pp. 1144
- Gomes, H.L.¹ Stallinga, P.² Rost, H.³ Holmes, A.B.⁴ Harrison, M.G.⁵ Friend, R.H.⁶

8
- 0002588084
- doi: 10.1016/S1566-1199(00)00004-5
- A.J. Campbell, D.D.C. Bradley, E. Werner, W. Brütting, Org. Electron. 1, 21 (2000) doi: 10.1016/S1566-1199(00)00004-5
- (2000) Org. Electron. , vol.1 , pp. 21
- Campbell, A.J.¹ Bradley, D.D.C.² Werner, E.³ Brütting, W.⁴

9
- 0033089526
- doi: 10.1063/1.369587
- J. Yang, J. Shen, J. Appl. Phys. 85, 2699 (1999) doi: 10.1063/1.369587
- (1999) J. Appl. Phys. , vol.85 , pp. 2699
- Yang, J.¹ Shen, J.²

10
- 0037439323
- doi: 10.1063/1.1531231
- D.Y. Kondakov, J.R. Sandifer, C.W. Tang, R.H. Young, J. Appl. Phys. 93, 1108 (2003) doi: 10.1063/1.1531231
- (2003) J. Appl. Phys. , vol.93 , pp. 1108
- Kondakov, D.Y.¹ Sandifer, J.R.² Tang, C.W.³ Young, R.H.⁴

11
- 0016081559
- doi: 10.1063/1.1663719
- D.V. Lang, J. Appl. Phys. 45, 3023 (1974) doi: 10.1063/1.1663719
- (1974) J. Appl. Phys. , vol.45 , pp. 3023
- Lang, D.V.¹

12
- 0040333870
- doi: 10.1063/1.1403669
- O. Gaudin, R.B. Jackman, T.P. Nguyen, P. Le Rendu, J. Appl. Phys. 90, 4196 (2001) doi: 10.1063/1.1403669
- (2001) J. Appl. Phys. , vol.90 , pp. 4196
- Gaudin, O.¹ Jackman, R.B.² Nguyen, T.P.³ Le Rendu, P.⁴

13
- 23844490822
- doi: 10.1063/1.1953870
- A. Kadashchuk, R. Schmechel, H. Von Seggern, U. Scherf, A. Vakhnin, J. Appl. Phys. 98, 024101 (2005) doi: 10.1063/1.1953870
- (2005) J. Appl. Phys. , vol.98 , pp. 024101
- Kadashchuk, A.¹ Schmechel, R.² Von Seggern, H.³ Scherf, U.⁴ Vakhnin, A.⁵

14
- 22944486680
- doi: 10.1063/1.1941482
- D. Poplavskyy, W. Su, F. So, J. Appl. Phys. 98, 014501 (2005) doi: 10.1063/1.1941482
- (2005) J. Appl. Phys. , vol.98 , pp. 014501
- Poplavskyy, D.¹ Su, W.² So, F.³

15
- 34247866296
- M. Arif, M. Yun, S. Gangopatdhyay, L. Fadiga, F. Galbrecht, U. Scherf, S. Guha, Phys. Rev. B. 75, 195202 (2007)
- (2007) Phys. Rev. B. , vol.75 , pp. 195202
- Arif, M.¹ Yun, M.² Gangopatdhyay, S.³ Fadiga, L.⁴ Galbrecht, F.⁵ Scherf, U.⁶ Guha, S.⁷

16
- 0031072114
- doi: 10.1016/S0379-6779(97)80214-7
- F. Papadimitrakopoulos, X.M. Zhang, Synthetic Metals 85, 1221 (1997) doi: 10.1016/S0379-6779(97)80214-7
- (1997) Synthetic Metals , vol.85 , pp. 1221
- Papadimitrakopoulos, F.¹ Zhang, X.M.²

17
- 79956015558
- doi: 10.1063/1.1459114
- V. Kazukauskas, H. Tzeng, S.A. Chen, Appl. Phys. Lett. 80, 2017 (2002) doi: 10.1063/1.1459114
- (2002) Appl. Phys. Lett. , vol.80 , pp. 2017
- Kazukauskas, V.¹ Tzeng, H.² Chen, S.A.³

18
- 0037017882
- doi: 10.1002/1521-4095(20020304)14:5<374::AID-ADMA374>3.0.CO;2-U
- E.W. List, R. Guentner, P. Scanduci De Freitas, U. Scherf, Adv. Mater. 14, 374 (2002) doi: 10.1002/ 1521-4095(20020304)14:5<374::AID-ADMA374>3.0.CO;2-U
- (2002) Adv. Mater. , vol.14 , pp. 374
- List, E.W.¹ Guentner, R.² Scanduci De Freitas, P.³ Scherf, U.⁴

19
- 2942604319
- doi: 10.1002/pssa.200404345
- S. Gamerith, C. Gadermaier, U. Scherf, E.J.W. List, Phys. Stat. Sol. (a) 201, 1132 (2004) doi: 10.1002/pssa.200404345
- (2004) Phys. Stat. Sol. (a) , vol.201 , pp. 1132
- Gamerith, S.¹ Gadermaier, C.² Scherf, U.³ List, E.J.W.⁴

20
- 20944450551
- doi: 10.1063/1.1897068
- Y.Y. Noh, D.Y. Kim, Y. Yoshida, K. Yase, B.J. Jung, E. Lim, H.K. Shim, R. Azumi, J. Appl. Phys. 97, 104504 (2005) doi: 10.1063/1.1897068
- (2005) J. Appl. Phys. , vol.97 , pp. 104504
- Noh, Y.Y.¹ Kim, D.Y.² Yoshida, Y.³ Yase, K.⁴ Jung, B.J.⁵ Lim, E.⁶ Shim, H.K.⁷ Azumi, R.⁸

21
- 33344460072
- doi: 10.1103/PhysRevB.71.205209
- P.J. Brewer, P.A. Lane, J. Huang, A.J. Demello, D.D.C. Bradley, J.C. Demello, Phys. Rev. B 71, 205209 (2005) doi: 10.1103/PhysRevB.71.205209
- (2005) Phys. Rev. B , vol.71 , pp. 205209
- Brewer, P.J.¹ Lane, P.A.² Huang, J.³ Demello, A.J.⁴ Bradley, D.D.C.⁵ Demello, J.C.⁶

22
- 33744778737
- doi: 10.1103/PhysRevB.73.235201
- T. Kreouzis, D. Poplavskyy, S.M. Tuladhar, M. Campoy-Quiles, J. Nelson, A.J. Campbell, D.D.C. Bradley, Phys. Rev. B 73, 235201 (2006) doi: 10.1103/PhysRevB.73.235201
- (2006) Phys. Rev. B , vol.73 , pp. 235201
- Kreouzis, T.¹ Poplavskyy, D.² Tuladhar, S.M.³ Campoy-Quiles, M.⁴ Nelson, J.⁵ Campbell, A.J.⁶ Bradley, D.D.C.⁷

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.