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Volumn 93, Issue 13, 2008, Pages

High quality GaN-based Schottky barrier diodes

Author keywords

[No Author keywords available]

Indexed keywords

GALLIUM ALLOYS; GALLIUM NITRIDE; SEMICONDUCTING GALLIUM;

EID: 53449089745     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2993353     Document Type: Article
Times cited : (17)

References (20)
  • 10
    • 0001062920 scopus 로고
    • 0021-8979 10.1063/1.335750.
    • K. Sato and Y. Yasumura, J. Appl. Phys. 0021-8979 10.1063/1.335750 58, 3655 (1985).
    • (1985) J. Appl. Phys. , vol.58 , pp. 3655
    • Sato, K.1    Yasumura, Y.2
  • 16
    • 0035896779 scopus 로고    scopus 로고
    • 0003-6951 10.1063/1.1361274.
    • J. E. Northrup, Appl. Phys. Lett. 0003-6951 10.1063/1.1361274 78, 2288 (2001).
    • (2001) Appl. Phys. Lett. , vol.78 , pp. 2288
    • Northrup, J.E.1
  • 18
    • 36849101960 scopus 로고
    • 0021-8979 10.1063/1.1656022.
    • J. R. Yeargan and H. L. Taylor, J. Appl. Phys. 0021-8979 10.1063/1.1656022 39, 5600 (1968).
    • (1968) J. Appl. Phys. , vol.39 , pp. 5600
    • Yeargan, J.R.1    Taylor, H.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.