-
1
-
-
33846293593
-
CCD radiation testing at low temperatures using a laboratory alpha particle source
-
Dec
-
G. R. Hopkinson and A. Mohammadzadeh, "CCD radiation testing at low temperatures using a laboratory alpha particle source," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3758-3763, Dec. 2006.
-
(2006)
IEEE Trans. Nucl. Sci
, vol.53
, Issue.6
, pp. 3758-3763
-
-
Hopkinson, G.R.1
Mohammadzadeh, A.2
-
2
-
-
33144483125
-
Hot pixel annealing behavior in CCDs irradiated at 84 C
-
Dec
-
C. J. Marshall, P. W. Marshall, A. Waczynski, E. J. Polidan, S. D. Johnson, R. A. Kimble, R. A. Reed, G. Delo, D. Schlossberg, A. M. Russell, T. Beck, Y. Wen, J. Yagelowich, and R. J. Hill, "Hot pixel annealing behavior in CCDs irradiated at 84 C," IEEE Trans. Nucl. Sci., vol. 52, no. 6, pp. 2672-2677, Dec. 2005.
-
(2005)
IEEE Trans. Nucl. Sci
, vol.52
, Issue.6
, pp. 2672-2677
-
-
Marshall, C.J.1
Marshall, P.W.2
Waczynski, A.3
Polidan, E.J.4
Johnson, S.D.5
Kimble, R.A.6
Reed, R.A.7
Delo, G.8
Schlossberg, D.9
Russell, A.M.10
Beck, T.11
Wen, Y.12
Yagelowich, J.13
Hill, R.J.14
-
3
-
-
10044251314
-
A study of hot pixel annealing in the hubble space telescope wide field camera 3 CCDs
-
E. J. Polidan et al., "A study of hot pixel annealing in the hubble space telescope wide field camera 3 CCDs," Proc. SPIE, vol. 5487, pp. 289-298, 2004.
-
(2004)
Proc. SPIE
, vol.5487
, pp. 289-298
-
-
Polidan, E.J.1
-
4
-
-
11144356359
-
Inflight performance of the advanced camera for surveys
-
M. Clampin et al., "Inflight performance of the advanced camera for surveys," Proc. SPIE, vol. 5167, pp. 235-242, 2004.
-
(2004)
Proc. SPIE
, vol.5167
, pp. 235-242
-
-
Clampin, M.1
-
5
-
-
47849106234
-
Radiation damage in Hubble space telescope detectors
-
M. Sirianni, M. Mutchler, R. Gilliland, J. Biretta, and R. Lucas, "Radiation damage in Hubble space telescope detectors," in Proc. IEEE Radiation Effects Data Workshop, 07TH8965, 2007, pp. 9-15.
-
(2007)
Proc. IEEE Radiation Effects Data Workshop, 07TH8965
, pp. 9-15
-
-
Sirianni, M.1
Mutchler, M.2
Gilliland, R.3
Biretta, J.4
Lucas, R.5
-
6
-
-
0038382293
-
Radiation effects on photonic imagers - A historical perspective
-
Jun
-
J. C. Pickel, A. H. Kalma, G. R. Hopkinson, and C. J. Marshall, "Radiation effects on photonic imagers - A historical perspective," IEEE Trans. Nucl. Sci., vol. 50, no. 3, pp. 671-688, Jun. 2003.
-
(2003)
IEEE Trans. Nucl. Sci
, vol.50
, Issue.3
, pp. 671-688
-
-
Pickel, J.C.1
Kalma, A.H.2
Hopkinson, G.R.3
Marshall, C.J.4
-
7
-
-
53349091787
-
Random Telegraph Signals In Proton Irradiated CCDs and APS
-
Aug
-
G. R. Hopkinson and A. Mohammadzadeh, "Random Telegraph Signals In Proton Irradiated CCDs and APS," IEEE Trans. Nucl. Sci., vol. 55, no. 4, pp. XXX-XXX, Aug. 2008.
-
(2008)
IEEE Trans. Nucl. Sci
, vol.55
, Issue.4
-
-
Hopkinson, G.R.1
Mohammadzadeh, A.2
-
8
-
-
33846298000
-
A framework for understanding displacement damage mechanisms in irradiated silicon devices
-
Dec
-
J. R. Srour and J. W. Palko, "A framework for understanding displacement damage mechanisms in irradiated silicon devices," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3610-3620, Dec. 2006.
-
(2006)
IEEE Trans. Nucl. Sci
, vol.53
, Issue.6
, pp. 3610-3620
-
-
Srour, J.R.1
Palko, J.W.2
-
9
-
-
53349124618
-
-
U.S. 6, May
-
B. Dierickx, "Detector for electromagnetic radiation, pixel structure with high sensitivity using such detector and method of manufacturing such detector," U.S. 6,225,670, May 2001.
-
(2001)
Detector for electromagnetic radiation, pixel structure with high sensitivity using such detector and method of manufacturing such detector
, pp. 225-670
-
-
Dierickx, B.1
-
10
-
-
53349084737
-
-
Available
-
[Online]. Available: www.srim.org.
-
-
-
-
11
-
-
11044232586
-
Alpha particle nonionizing energy loss (NIEL)
-
Dec
-
I. Jun, M. A. Xapsos, and E. A. Burke, "Alpha particle nonionizing energy loss (NIEL)," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3207-3210, Dec. 2004.
-
(2004)
IEEE Trans. Nucl. Sci
, vol.51
, Issue.6
, pp. 3207-3210
-
-
Jun, I.1
Xapsos, M.A.2
Burke, E.A.3
-
12
-
-
0028711773
-
A comparison of Monte Carlo and analytical treatments of displacement damage in Si microvolumes
-
Dec
-
C. J. Dale, L. Chen, P. J. McNulty, P. W. Marshall, and E. A. Burke, "A comparison of Monte Carlo and analytical treatments of displacement damage in Si microvolumes," IEEE Trans. Nucl. Sci., vol. 41, no. 6, pp. 1974-1983, Dec. 1994.
-
(1994)
IEEE Trans. Nucl. Sci
, vol.41
, Issue.6
, pp. 1974-1983
-
-
Dale, C.J.1
Chen, L.2
McNulty, P.J.3
Marshall, P.W.4
Burke, E.A.5
-
13
-
-
33144475796
-
Radiation effects on astrometrie CCDs at low operating temperatures
-
Dec
-
G. R. Hopkinson, A. Short, C. Vetel, I. Zayer, and A. D. Holland, "Radiation effects on astrometrie CCDs at low operating temperatures," IEEE Trans. Nucl. Sci., vol. 52, no. 6, pp. 2664-2671, Dec. 2005.
-
(2005)
IEEE Trans. Nucl. Sci
, vol.52
, Issue.6
, pp. 2664-2671
-
-
Hopkinson, G.R.1
Short, A.2
Vetel, C.3
Zayer, I.4
Holland, A.D.5
-
14
-
-
0025596382
-
-
C.J. Dale, P. W. Marshal 11, and E. A. Burke, Particle-induced spatial dark current fluctuations in focal plane arrays, IEEE Trans. Nucl. Sci., 37, no. 6, pp. 1784-1791, Dec. 1990.
-
C.J. Dale, P. W. Marshal 11, and E. A. Burke, "Particle-induced spatial dark current fluctuations in focal plane arrays," IEEE Trans. Nucl. Sci., vol. 37, no. 6, pp. 1784-1791, Dec. 1990.
-
-
-
-
15
-
-
33745451611
-
Single silicon vacancy-oxygen complex defect and variable retention time phenomenon in dynamic random access memories
-
T. Umeda, K. Okonogi, S. Tsukada, K. Hamada, S. Fujieda, and Y. Mochizuki, "Single silicon vacancy-oxygen complex defect and variable retention time phenomenon in dynamic random access memories," Appl. Phys. Lett., vol. 88, pp. 243504-1-243504-3, 2006.
-
(2006)
Appl. Phys. Lett
, vol.88
-
-
Umeda, T.1
Okonogi, K.2
Tsukada, S.3
Hamada, K.4
Fujieda, S.5
Mochizuki, Y.6
-
16
-
-
45749116115
-
Radiation-induced deep-level traps in CCD image sensors
-
paper #0994-F12-07
-
C. Tivarus and W. C. McColgin, "Radiation-induced deep-level traps in CCD image sensors," Mater. Res. Soc. Proc., vol. 994, 2007, paper #0994-F12-07.
-
(2007)
Mater. Res. Soc. Proc
, vol.994
-
-
Tivarus, C.1
McColgin, W.C.2
-
17
-
-
34548433082
-
Effects of clustering on the properties of defects in neutron irradiated silicon
-
R. M. Fleming, C. H. Seager, D. V. Lang, P. J. Cooper, E. Bielejec, and J. M. Campbell, "Effects of clustering on the properties of defects in neutron irradiated silicon," J. Appl. Phys., vol. 102, pp. 043711-1-043711-13, 2007.
-
(2007)
J. Appl. Phys
, vol.102
-
-
Fleming, R.M.1
Seager, C.H.2
Lang, D.V.3
Cooper, P.J.4
Bielejec, E.5
Campbell, J.M.6
-
18
-
-
0036807527
-
Neutron-irradiation-induced effects caused by divacancy clusters with a tetravacancy core in float-zone silicon
-
P. F. Ermolov, D. E. Karmanov, A. K. Leflat, V. M. Manankov, M. M. Merkin, and E. K. Shabalina, "Neutron-irradiation-induced effects caused by divacancy clusters with a tetravacancy core in float-zone silicon," Semiconductors, vol. 36, no. 10, pp. 1114-1122, 2002.
-
(2002)
Semiconductors
, vol.36
, Issue.10
, pp. 1114-1122
-
-
Ermolov, P.F.1
Karmanov, D.E.2
Leflat, A.K.3
Manankov, V.M.4
Merkin, M.M.5
Shabalina, E.K.6
-
19
-
-
0035121083
-
Deeplevel transient spectroscopy of silicon detectors after 24 GeV proton irradiation and 1 MeV neutron irradiation
-
M. Ahmed, S. J. Watts, J. Matheson, and A. Holmes-Seidle, "Deeplevel transient spectroscopy of silicon detectors after 24 GeV proton irradiation and 1 MeV neutron irradiation," Nucl. Instrum. Meth. Phys. Res., A, vol. 457, pp. 588-594, 2001.
-
(2001)
Nucl. Instrum. Meth. Phys. Res., A
, vol.457
, pp. 588-594
-
-
Ahmed, M.1
Watts, S.J.2
Matheson, J.3
Holmes-Seidle, A.4
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