Hot pixel annealing behavior in CCDs irradiated at-84°C

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 2672-2677

  Marshall, C J ^a,b   Marshall, P W ^a,c   Waczynski, A ^a,d   Polidan, E J ^a,d   Johnson, S D ^a,d   Kimble, R A ^a,b   Reed, R A ^a,e   Delo, G ^d   Schlossberg, D ^f   Russell, A M ^d   Beck, T ^f   Wen, Y ^g   Yagelowich, J ^b   Hill, R J ^g  

^a IEEE   (United States)

^b NASA HEADQUARTERS   (United States)

^c Global Science and Technology ^*

^d GLOBAL SCIENCE AND TECHNOLOGY   (United States)

^e VANDERBILT UNIVERSITY   (United States)

^f Sigma Space Inc   (United States)

^g SCIENCE SYSTEMS AND APPLICATIONS INC   (United States)

Author keywords

CCDs; Displacement damage; Hot pixels; Radiation effects

Indexed keywords

DISPLACEMENT DAMAGE; HOT PIXELS;

ANNEALING; CHARGE COUPLED DEVICES; COOLING; RADIATION EFFECTS;

SPACE TELESCOPES;

EID: 33144483125     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.860731     Document Type: Conference Paper

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