Radiation-induced deep-level traps in CCD image sensors

Materials Research Society Symposium Proceedings

Volumn 994, Issue , 2007, Pages 347-352

  Tivarus, Cristian ^a   McColgin, William C ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES;

CCD IMAGE SENSORS; DEEP LEVEL TRAP; GENERATION RATE; RADIATION-INDUCED;

DEFECTS;

EID: 45749116115     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0994-f12-07     Document Type: Conference Paper

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